Corrigendum: Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
نویسندگان
چکیده
“Research supported by Oak Ridge National Laboratory’s (ORNL) Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy (DOE), Office of Science User Facility (XS, JD, SVK, SJ, RRU), by the Division of Materials Sciences and Engineering, Office of Basic Energy Sciences, DOE (ARL) and by ORNL’s Laboratory Directed Research and Development Program, which is managed by UT-Battelle LLC for the U.S. DOE (SJ)”.
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Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates from the assigned location depending on the properties of the deflectors. To reduce these deviation...
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